X-ray Structure Analysis Centre

Based on X-ray diffraction analysis, researchers determine the structure defined as the relative positions of the atoms or ions which make up the substance under investigation. As a result, the geometrical description of the structure in terms of bond lengths and angles and other quantities of interest become possible. The method is used for characterisation of organic, organometallic and coordination compounds, metallic and ceramic materials and semiconductors. The center includes laboratories for single crystal investigations and for powder diffraction studies.

Contact information

Head: Tim Grüne

Deputy Heads: Klaus Richter & Alexander Roller


Office: Mon-Thu: 09:00-17:00, Fri: 09:00-14:00: Elfriede Limberger

Location: 1090 Vienna, Währinger Straße 42

Single Crystal X-Ray Diffraction


Bruker D8

  • Mo & Cu IµS Source
  • Photon® CMOS Detector
  • 4-Circle Kappa Goniometer
  • Kryoflex II Cooling System (80 K – RT)

Bruker X8

  • Mo IµS Source
  • APEX II CCD Detector
  • 4-Circle Kappa Goniometer
  • Kryoflex I Cooling System (100K – RT)


  • APEX2 v2013.6-2 © BRUKER AXS 2004 – 2014
  • ShelXle REVISION 654, J. Appl. Cryst. (2011) 44, 1281-1284
  • Olex2 v1.2 © OlexSys Ltd. 2004 – 2014

Powder Diffraction


Bruker D8 Advance Diffractometer

  • Cu Ka , Co Ka (optional with primary monochromator)
  • Highspeed Lynxeye® detector & energy dispersive SolX® detector
  • Theta / 2Theta geometry, reflection setting
  • Autosampler (7fold)

Five Guinier-Huber Image Plate Cameras

  • Monochromated Cu, Fe and Mo radiation


  • TOPAS v3 Rietveld program, © BRUKER AXS 2004 – 2014